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Abstract Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of four beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in five weeks.more » « lessFree, publicly-accessible full text available December 1, 2025
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Zheng, Zhihao; Ying, Xiaowen; Yao, Zhen; Chuah, Mooi Choo (, IEEE)
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Ying, Xiaowen; Lang, Bo; Zheng, Zhihao; Chuah, Mooi Choo (, ACM)
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Zheng, Zhihao; Li, Feng; Fisher, Corey; Ali, Iqbal J.; Sharifi, Nadiya; Calle-Schuler, Steven; Hsu, Joseph; Masoodpanah, Najla; Kmecova, Lucia; Kazimiers, Tom; et al (, Current Biology)
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